The next Agronomy and Horticulture seminar is Sept. 26
Anil Chandran, Ph.D., research technologist in the Department of Agronomy and Horticulture at the University of Nebraska–Lincoln, will present “Genetic Basis of Grain Yield and Quality under Heat Stress in Rice” on Sept. 26 at 11 a.m. in Keim Hall 150 or streamed live via Zoom at https://go.unl.edu/seminars.
Heat stress during the grain-filling period has a detrimental effect on rice yield and quality. The development of heat-resilient cultivars could help address this issue if tolerant alleles can be identified and incorporated into the germplasm. This presentation will focus on the research conducted to understand the genetic basis of grain yield and quality under heat stress in rice.